The proposed model is extensively validated with calibrated Technology Computer-Aided Design (TCAD) simulations as well as with experimental data from multiple technologies. Additionally, it ...
To address this issue, various materials for barrier/liner in the BPR structure are explored and evaluated using TCAD simulation. It turned out that the BPR-induced field effect was suppressed as the ...
Based on interconnect resistance values from technology computer-aided design (TCAD) simulations and MRAM device characteristics from experimentally validated/calibrated physical models, we quantify ...
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